A BRIEF CONVERSATION WITH JIM WASILEWSKI, MICROBOARD TEST ENGINEERING MANAGER:
Over the past ten years, Microboard has been steadily building a reputation for excellence in RF Build and Test Services. Microboard’s commitment to Functional Testing supported by its’ team of dedicated engineers, has become an essential part in ensuring a final product that meets and even exceeds our customers’ needs.
Jim Wasilewski heads up Microboard’s Test Engineering department. He took a few minutes to talk about the role of RF Test in Microboard’s goal to provide “excellence across the board.”
“I think credit has to go to our precision process,” Jim begins, eager to talk about something he is obviously passionate about, enough so to pause next to one of Microboard’s Mirtec inspection stations. “The build itself has to be perfect, a single, one-time only pass. To achieve this, we rely on our experienced staff and the equipment we use. The Fuji NXT III lines are a big part of this aim at perfection, as are all of the surrounding support elements, our Screening and Inspection processes, AOI and X-Ray capabilities. These are all critical pieces, but the most critical part is the team we have in place. Their product knowledge and training makes it all come together.”
“Our world is rapidly becoming more wireless and cordless. Wireless communication is evolving faster with devices that are becoming smaller and more complex with many more functions, security issues and design challenges. Take a simple garage door opener as an example. For many years it provided one function, open/close the door. But now it may do a variety of other communication functions, such as signaling “door open” or “door closed” to your Smart Phone. To accomplish this, information has to be encoded, decoded, in A/D, D/A exchanges that need to be both highly accurate and secure via a wireless RF signal path. Every design is unique. At Microboard we’ve put together a team that knows the product’s technology well, how to produce it reliably and often with improvements, regardless of the increasing complexity and smaller sizes.”